Rockchip RK2206 Secure Digital IO

ID: RK-KF-YF-049

Release Version: 1.0.0

Date: 2019-11-29

Security Level: Public

DISCLAIMER

THIS DOCUMENT IS PROVIDED "AS IS". FUZHOU ROCKCHIP ELECTRONICS CO., LTD. ("COMPANY") DOES NOT PROVIDE ANY WARRANTY OF ANY KIND, EXPRESSED OR IMPLIED, OTHERWISE, WITH RESPECT TO THE ACCURACY, RELIABILITY, COMPLETENESS, MERCHANTABILITY, FITNESS FOR ANY PARTICULAR PURPOSE OR NON-INFRINGEMENT OF ANY REPRESENTATION, INFORMATION AND CONTENT IN THIS DOCUMENT. THIS DOCUMENT IS FOR REFERENCE ONLY.

DUE TO PRODUCT VERSION UPGRADES OR OTHER REASONS, THIS DOCUMENT MAY BE UPDATED OR MODIFIED FROM TIME TO TIME WITHOUT ANY NOTICE.

Trademark Statement

"Rockchip", "Rockchip", "Rockchip" are registered trademarks of the Company and owned by the Company.

All other registered trademarks or trademarks mentioned in this document are owned by their respective owners.

Fuzhou Rockchip Electronics Co., Ltd.

No. 18, Area A, Software Park, Tongpan Road, Fuzhou, Fujian Province

Website: www.rock-chips.com

Customer Service Tel: +86-4007-700-590

Customer Service Fax: +86-591-83951833

Customer Service Email: fae@rock-chips.com

Preface

Overview

This document mainly describes the configuration and usage of the RK2206 SDIO.

Product Versions

Chip Name	Kernel Version
RK2206	FreeRTOS V10.0.1

Intended Audience

This document (this guide) is mainly intended for the following engineers:

Technical support engineers

Software development engineers

Revision History

Date	Version	Author	Change Description
2019-11-26	V1.0.0	Shawn Lin	Initial version

[TOC]

1 SDIO (Secure Digital IO)

1.1 Purpose

Used as an external bus for connecting slave devices. Supported peripheral types include SD/TF cards, SDIO function devices (common Wi-Fi, BT, etc.), MMC (Multi-media card), eMMC (embedded MMC).

1.2 Configuration

First, enable the controller driver DRIVER_SDMMC

    BSP Driver  --->
        [*] Enable SDMMC

Select the corresponding protocol stack according to the required external device (to reduce code size, select as needed):

    BSP Driver  --->
       [*] Enable SD
       [*] Enable SDIO
       [*] Enable EMMC

If shell test commands are needed for testing, enable the corresponding test tools:

    Components Config --->
        Command shell  --->
            [*] Enable Sdmmc Shell
            [*] Enable SD Card Shell
            [*] Enable Sdio Shell
            [*] Enable Emmc Shell

If board-level configuration needs to be modified, please modify the board.c file of the corresponding project.

INIT API void SdMmcDevHwInit(uint32 DevID, uint32 Channel, struct HAL_MMC_HOST *host)
{
    if (DevID != 0)
    {
        rk_printf("%s invalid DevID\n", __func__);
        return;
    }

    ClkEnableById(HCLK_SDMMC_GATE);
    ClkEnableById(CLK_SDMMC_DT50_GATE);
    /* To modify the interface frequency, set 2 times the frequency value. Currently works at 48MHz */
    ClkSetRate(CLK_SDMMC, 96000000);

    host->pReg = (struct MMC_REG *)SDMMC_BASE;
    host->irq = SD_MMC_IRQn;

    iomux_config_sdmmc();
    GRF->SOC_CON15 = GRF_SOC_CON15_GRF_SARADC_IEN_MASK << 16;
    /* Currently, both sample delay and output delay are set at the first falling edge of the clock, i.e., 90 degrees. Can be modified as needed */
    CRU->SDMMC_CON[0] = CRU_SDMMC_CON00_INIT_STATE_MASK | CRU_SDMMC_CON00_INIT_STATE_MASK << 16;
    CRU->SDMMC_CON[0] = (0x2 << CRU_SDMMC_CON00_DRV_DEGREE_SHIFT) | (CRU_SDMMC_CON00_DRV_DEGREE_MASK << 17);
    CRU->SDMMC_CON[1] = (0x1 << CRU_SDMMC_CON01_SAMPLE_DEGREE_SHIFT) | (CRU_SDMMC_CON01_SAMPLE_DEGREE_MASK << 17);
    CRU->SDMMC_CON[0] = CRU_SDMMC_CON00_INIT_STATE_MASK << 16;

    rk_interrupt_register(host->irq, SdcIntIRQ0);
    rk_interrupt_pending_clear(host->irq);
    rk_interrupt_unmask(host->irq);
}

1.3 Code and API

Controller driver src/driver/sdmmc/SdMmcDevice.c, not to be referenced outside the protocol stack
SDIO enumeration protocol stack src/driver/sdio/SdioDevice.c
SD/TF card enumeration protocol stack src/driver/sd/SdDevice.c
(e)MMC enumeration protocol stack src/driver/emmc/EmmcDevice.c

/* SD/TF card and EMMC len are in sector units, i.e., 512 Bytes */
extern rk_size_t SdDev_Write(HDC dev, rk_size_t LBA, const uint8 *buffer, rk_size_t len);
extern rk_size_t SdDev_Read(HDC dev, rk_size_t LBA, uint8 *buffer, rk_size_t len);
extern rk_size_t EmmcDev_Read(HDC dev, rk_size_t LBA, uint8 *buffer, rk_size_t len);
extern rk_size_t EmmcDev_Write(HDC dev, rk_size_t LBA, const uint8 *buffer, rk_size_t len);

/* SDIO count is in Bytes */
extern rk_err_t SdioDev_Memcpy_FromIo(HDC hSdioFun, void *dst, uint32 addr, uint32 count);
extern rk_err_t SdioDev_Memcpy_ToIo(HDC hSdioFun, uint32 addr, void *src, uint32 count);
extern rk_err_t SdioDevDelete(uint8 DevID, void *arg);
extern rk_err_t SdioDev_DisalbeInt(HDC dev, uint32 FuncNum);
extern rk_err_t SdioDev_EnableInt(HDC dev, uint32 FunNum);
extern HDC SdioDev_GetFuncHandle(HDC dev, uint32 FuncNum);
extern rk_err_t SdioDev_Writew(HDC hSdioFun, uint32 b, uint32 addr);
extern rk_err_t SdioDev_Readw(HDC hSdioFunc, uint32 addr);
extern rk_err_t SdioDev_Writel(HDC hSdioFun, uint32 b, uint32 addr);
extern rk_err_t SdioDev_Readl(HDC hSdioFun, uint32 addr);
extern rk_err_t SdioDev_SetBlockSize(HDC hSdioFun, uint32 BlockSize);
extern rk_err_t SdioDev_WriteSb(HDC hSdioFun, uint32 addr, void *src, uint32 count);
extern rk_err_t SdioDev_ReadSb(HDC hSdioFun, void *dst, uint32 addr, uint32 count);
extern rk_err_t SdioDev_Readb(HDC hSdioFunc, uint32 addr);
extern rk_err_t SdioDev_Writeb(HDC hSdioFunc, uint8 b, uint32 addr);
extern rk_err_t SdioDev_DisableFunc(HDC hSdioFunc);
extern rk_err_t SdioDev_EnalbeFunc(HDC hSdioFunc);
extern HDC SdioDev_Create(uint8 DevID, void *arg);
extern void SdioIrqTask(void *pvParameters);
extern rk_err_t SdioIntIrqInit(void *pvParameters, void *arg);
extern rk_err_t SdioIntIrqDeInit(void *pvParameters);
extern int SdioDev_Claim_irq(void *_func, sdio_irq_handler_t *handler);
extern int sdio_release_irq(void *func);

2 SHELL Test and Output

2.1 SD/TF Card Test Commands

2.1.1 Read/Write Test

SD card testing may damage the SD card file system. Please back up SD card data before testing and format it after testing. In SD card test commands, ensure the parameters are valid, such as the SD card operation address. The SD card device number is fixed at 0.

RK2206>sd.write 0 0x8e9c 4 0x77
0 represents the device number. Write 4 blocks of data at SD card address 0x8e9c (the SD card operation address can be specified, must be within a valid address range), with data filled with byte 0x77 (can be any byte value).

RK2206>sd.read 0 0x8e9c 4
0 represents the device number. Read 4 blocks of data at SD card address 0x8e9c (same as the write address above).

Test log:

RK2206>sd.write 0 0x8e9c 4 0x77create thread classId = -1, objectid = 8, name = SdTestTask, remain = 4085528
[A.14.00][001588.482627]
RK2206>DevID = 0, LBA = 36508, blks = 4 value = 0x77
[A.SdTes][001588.489430]
[A.SdTes][001588.503002]  sd Write Data success
[A.SdTes][001588.507076]delete thread classId = -1, objectid = 8, name = SdTestTask, remain = 4069136.
[A.SdTes][001588.519801]

RK2206>sd.read 0 0x8e9c 4create thread classId = -1, objectid = 3, name = SdTestTask, remain = 6211448
[A.14.00][000029.571868]
RK2206>DevID = 0, LBA = 36508, blks = 4
[A.SdTes][000029.581561]
[A.SdTes][000029.587681]  sd Read Data success
[A.SdTes][000029.594030]
[A.SdTes][000029.603383][381109c0]77 77 77 77 77 77 77 77 77 77 77 77 77 77 77 77
[A.SdTes][000029.619609][381109d0]77 77 77 77 77 77 77 77 77 77 77 77 77 77 77 77
[A.SdTes][000029.632840][381109e0]77 77 77 77 77 77 77 77 77 77 77 77 77 77 77 77
[A.SdTes][000029.643058][381109f0]77 77 77 77 77 77 77 77 77 77 77 77 77 77 77 77
[A.SdTes][000029.651280][38110a00]77 77 77 77 77 77 77 77 77 77 77 77 77 77 77 77
[A.SdTes][000029.666512][38110a10]77 77 77 77 77 77 77 77 77 77 77 77 77 77 77 77
[A.SdTes][000029.678728][38110a20]77 77 77 77 77 77 77 77 77 77 77 77 77 77 77 77
[A.SdTes][000029.687951][38110a30]77 77 77 77 77 77 77 77 77 77 77 77 77 77 77 77
[A.SdTes][000029.704184][38110a40]77 77 77 77 77 77 77 77 77 77 77 77 77 77 77 77

2.1.2 Consistency Test

Test command:

sd.test 0 0x8e9c 4
Device number 0, at SD card address 0x8e9c (the SD card operation address can be specified, must be within a valid address range), perform read-write consistency test on 4 blocks.

Test log:

RK2206>
RK2206>sd.test 0 0x8e9c 4create thread classId = -1, objectid = 4, name = SdTestTask, remain = 6146584
[A.14.00][005590.823303]
RK2206>DevID = 0, LBA = 36508, blks = 4
[A.SdTes][005590.837009]
[A.SdTes][005590.851304]  Sd write-read-compare Test Successfully 0
[A.SdTes][005590.855812]
[A.SdTes][005590.863215]  Sd write-read-compare Test Successfully 1
[A.SdTes][005590.876049]
[A.SdTes][005590.882452]  Sd write-read-compare Test Successfully 2
[A.SdTes][005590.893286]
[A.SdTes][005590.900238]  Sd write-read-compare Test Successfully 3
[A.SdTes][005590.909515]
[A.SdTes][005590.921914]  Sd write-read-compare Test Successfully 4

2.1.3 Performance Test

RK2206>file.setpath C:\

RK2206>file.test 512 512 1
Test a total of 512 blocks, each block size 512 bytes, test 1 block at a time (can be changed to 4 blocks at a time).

Test log:

[A.14.00][000068.429157]total clk = 3022, 6853, 6853read: LBA = 0x000001fc, Len = 1, readus = 34497
[A.14.00][000068.442706]total clk = 2410, 6854, 6854read: LBA = 0x000001fd, Len = 1, readus = 34557
[A.14.00][000068.454297]total clk = 2790, 6855, 6855read: LBA = 0x000001fe, Len = 1, readus = 34626
[A.14.00][000068.464846]total clk = 2558, 6856, 6856read: LBA = 0x000001ff, Len = 1, readus = 34689
  test end: totalsize = 262144, blocksize = 512, writerate = 30577 byte/s, readrate = 7710117 byte/s

2.2 eMMC Test

eMMC testing only requires changing "sd.write/sd.read" in the SD card test commands to "emmc.write/emmc.read". Other parameters remain unchanged.

2.3 SD/TF Card Auto Enumeration Output Information

Generally, boards with SD/TF cards perform auto enumeration at boot. If correctly enumerated, the following print will show the specific card type and capacity information.

***************************************************************************
*    Copyright (C) Fuzhou Rockchips Electronics CO.,Ltd                   *
*                                                                         *
*        Welcome to Use RKOS V2.0.0(D):a9b6f04d, 195d803                   *
*        Built : 08:41:43, Nov 13 2019                                    *
***************************************************************************
RK2206>
[a][000000.593663] sdc resp timout
[a][000000.601058]
[A.19.00][000000.760803]30.01GB SDHC Card

Table of Contents​

1 SDIO (Secure Digital IO)​

1.1 Purpose​

1.2 Configuration​

1.3 Code and API​

2 SHELL Test and Output​

2.1 SD/TF Card Test Commands​

2.2 eMMC Test​

2.3 SD/TF Card Auto Enumeration Output Information​

Table of Contents

1 SDIO (Secure Digital IO)

1.1 Purpose

1.2 Configuration

1.3 Code and API

2 SHELL Test and Output

2.1 SD/TF Card Test Commands

2.2 eMMC Test

2.3 SD/TF Card Auto Enumeration Output Information